Dell EMC Open Networking Troubleshooting Guide March 2019

memtool

The memory tool ( memtool) tests system memory.

EDA Quick Test mode only completes simple access (read) tests. You can use memtool to test static memory areas, such as L2Cache mapped as SRAM or DRAM on a memory mapped device.

The memory configuration file consists of lines that describe a region of memory and the tests performed on that memory region. Therefore, you can have multiple entries for a region of memory. All parameters are separated by a : character. The following describes the configuration file parameters.

Parameter

Description

Region Name:

The region name referred to in all output.

Start Address:

The starting address for the region of memory in hexadecimal format (without the preceding 0x). If the operating software is defining how to manage memory, this is dynamic and you can use “-” for the start address and the memory uses malloc’d from the available system memory.

Size:

The size of the contiguous memory area (in bytes) in hexadecimal (without the preceding 0x). If memory is dynamic, use “-” for size and the tests use the maximum system memory.

Access:

The letter that describes how this memory is accessed:

b — byte (8 bits)

h — halfword (16 bits)

w — word (32 bits)

d — double-word (64 bits)

Increment:

How many bytes to increment to the next cell.

ECC:

Describes if ECC is supported — 0 or 1.

Chunk:

Describes how many kilo bytes (1024 bytes) are tested in one chunk. Tests multiple chunks across the memory region.

Max Cache:

The maximum cache size for this memory.

Cacheline:

The size of a cacheline.

Iterations:

The number of times to perform the tests.

Test:

The collection of bits that tell which test to perform on this region. The tests are performed in bit order. Some tests may not be performed due to time limitations and the purpose of the test (for example, dim cache memory test which is time consuming and destructive to data). To run an excluded test, you must specifically request the test. For example, to run all tests including the dim cache memory test, which is a 0x800, set the tests to fff.

A-1 — run all available tests.

Descriptive Device:

The descriptive device (for example, SPD in the case of a dimm), is described in one comma-separated field of four parameters: address, type, start, and bytes.

Device Path:

The path to the device driver (for example, /dev/i2c-0 for a PD on the i2c bus 0).

Address of Memory Description device (SPD):

Describes the memory organization (for example, dimm memory which has an SPD device) and the address of the device. For i2c devices, the address is presented in 7–bit hexadecimal format.

Type:

SPD

Range of bytes in the Description Device:

These two fields list the start and end registers to read descriptive entries for the device.

Example of the `memtool` Output

Syntax: ./memtool <option> 
                                 -h := show this help
                                 test [[all]|list|region#] := test using the MEM test config file
                                 info  := display configuration info of device
                                 read [b|h|w] address := read the specified physical address
                                 write [b|h|w] address data [length] := write at the specified physical address

Example of the `memtool` Configuration File Output

//    Memory Configuration File
                                 //
                                 //    Example: 
                                 //    SystemRam:-:-:w:4:1:2800:0:0:1:-1:SPD:/dev/i2c-0:50:0,ff:
                                 //    This describes the SystemRam which is dynamic in location and size.  It is accessed by words //    and incremented addresses
                                 of 4 bytes. It is ECC covered, and has a max chunk of 10KB max 
                                 //    cache and cacheline size (unused at this time) are 0.  The tests will be performed once on this 
                                 //    region, and the -1 denotes to run all tests, excluding dim cache memory test. The Descriptive 
                                 //   device is a SPD on /dev/i2c-0 at address 0x50, and we read registers 0-255.
                                 //
                                 //    Note: a '-' address and size denotes a dynamic ram allocation
                                 //    =======================Tests================================
                                 //    -1  : all Tests Run
                                 //     0h : No Address Test 
                                 //     1h : Address Read Test (Access)
                                 //     2h : Address Read|Modify|Write|Verify
                                 //     4h : Address walking 1's
                                 //     8h : Address walking 0's
                                 //     00h : No Data Test 
                                 //     10h : Data Read Test (Access)
                                 //     20h : Data Read|Modify|Write|Verify
                                 //     40h : Data walking 1's
                                 //     80h : Data walking 0's
                                 //    100h : Data walking 1's
                                 //    200h : Data walking 0's
                                 //    400h : patterns (00ff, ff00, 55aa, aa55)
                                 //    800h : Cache (cacheKiller - Not Part of ALL Tests)
                                 
                                 SystemRam:-:-:d:8:1:2800:-1:-1:1:-1:i2c:0x52,SPD,0,255

Welcome

Welcome to Dell

Dell EMC Open Networking Troubleshooting Guide March 2019

memtool

Example of the memtool Output

Example of the memtool Configuration File Output

Rate this content

Example of the `memtool` Output

Example of the `memtool` Configuration File Output